Refractometer for tracking changes in the refractive index of air near 780 nm

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A Refractometer for tracking the changes in the refractive index of air near 780 nm

A new system, consisting of a double channel Fabry Perot etalon and laser diodes emitting around 780 nm is described and proposed to be used for air refractive index measurements. The principle of this refractometer is based on frequency measurements between optical laser sources. It permits quasi-instantaneous measurement with a resolution better than 10 9 − and uncertainty in the 10 8 − range...

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Refractometer for tracking changes in the refractive index of air near 780 nm.

A new system, consisting of a double-channel Fabry-Perot etalon and laser diodes emitting around 780 nm, is described and proposed for use for measuring air-refractive index. The principle of this refractometer is based on frequency measurements between optical laser sources. It permits quasi-instantaneous measurement with a resolution of better than 10(-9) and uncertainty in the 10(-8) range. ...

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ژورنال

عنوان ژورنال: Applied Optics

سال: 1998

ISSN: 0003-6935,1539-4522

DOI: 10.1364/ao.37.000156